root@sv7[~]# smartcttl -a /dev/sdg
zsh: command not found: smartcttl
root@sv7[~]# smartctl -a /dev/sdg
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.79+truenas] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Ultrastar (He10/12)
Device Model: WDC WD120EDAZ-11F3RA0
Serial Number: 5PK5NW2B
LU WWN Device Id: 5 000cca 291ecdab9
Firmware Version: 81.00A81
User Capacity: 12,000,138,625,024 bytes [12.0 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Feb 17 18:17:41 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 241) Self-test routine in progress...
10% of test remaining.
Total time to complete Offline
data collection: ( 87) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1233) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0004 128 128 054 Old_age Offline - 108
3 Spin_Up_Time 0x0007 222 222 024 Pre-fail Always - 322 (Average 272)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 97
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000a 100 100 067 Old_age Always - 0
8 Seek_Time_Performance 0x0004 140 140 020 Old_age Offline - 15
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 13351
10 Spin_Retry_Count 0x0012 100 100 060 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 97
22 Helium_Level 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 646
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 646
194 Temperature_Celsius 0x0002 175 175 000 Old_age Always - 37 (Min/Max 22/46)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 292
SMART Error Log Version: 1
ATA Error Count: 292 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 292 occurred at disk power-on lifetime: 13277 hours (553 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 70 00 f0 2b c4 40 00 30d+02:48:05.226 READ FPDMA QUEUED
60 48 00 a8 2b c4 40 00 30d+02:48:05.226 READ FPDMA QUEUED
60 28 10 80 2b c4 40 00 30d+02:48:05.225 READ FPDMA QUEUED
60 20 08 60 2b c4 40 00 30d+02:48:05.225 READ FPDMA QUEUED
60 28 00 10 2b c4 40 00 30d+02:48:05.225 READ FPDMA QUEUED
Error 291 occurred at disk power-on lifetime: 13272 hours (553 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 20 08 a0 e7 a1 40 00 29d+21:49:16.434 READ FPDMA QUEUED
60 28 00 78 e7 a1 40 00 29d+21:49:16.434 READ FPDMA QUEUED
60 20 00 30 e7 a1 40 00 29d+21:49:16.434 READ FPDMA QUEUED
60 28 00 08 e7 a1 40 00 29d+21:49:16.433 READ FPDMA QUEUED
60 20 00 c0 e6 a1 40 00 29d+21:49:16.426 READ FPDMA QUEUED
Error 290 occurred at disk power-on lifetime: 6146 hours (256 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 10 80 03 01 40 00 00:05:40.782 READ FPDMA QUEUED
60 80 18 00 04 01 40 00 00:05:40.780 READ FPDMA QUEUED
60 80 08 00 03 01 40 00 00:05:40.780 READ FPDMA QUEUED
60 20 00 e0 02 01 40 00 00:05:40.780 READ FPDMA QUEUED
60 60 18 80 02 01 40 00 00:05:40.778 READ FPDMA QUEUED
Error 289 occurred at disk power-on lifetime: 6146 hours (256 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 00 80 fe 00 40 00 00:05:39.775 READ FPDMA QUEUED
60 80 08 00 ff 00 40 00 00:05:39.774 READ FPDMA QUEUED
60 80 00 00 fe 00 40 00 00:05:39.774 READ FPDMA QUEUED
60 80 00 80 fd 00 40 00 00:05:39.773 READ FPDMA QUEUED
60 80 00 00 fd 00 40 00 00:05:39.772 READ FPDMA QUEUED
Error 288 occurred at disk power-on lifetime: 6146 hours (256 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 08 00 fa 00 40 00 00:05:38.757 READ FPDMA QUEUED
60 80 00 80 f9 00 40 00 00:05:38.756 READ FPDMA QUEUED
60 80 00 00 f9 00 40 00 00:05:38.756 READ FPDMA QUEUED
60 80 08 80 f8 00 40 00 00:05:38.754 READ FPDMA QUEUED
60 80 00 00 f8 00 40 00 00:05:38.754 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 13330 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute d